Screw dislocation dipoles in niobium: combination of STM observations and atomistic simulations
J. Bonneville, C. Coupeau, J. Douin, R. Gröger
Modelling_Simul._Mater._Sci._Eng._32 (2024) 065021
Asymmetry of anticrossing between atomic steps on metal and semiconductor surfaces
V.S. Khoroshilov, D.M. Kazantsev, V.L. Alperovich, C. Coupeau, M. Drouet
Journal of Physics 2227 (2022) 012008
External stress as a way to control Au(111) reconstruction
D. Chauraud, J. Durinck, L. Vernisse, S. Smalley, C. Coupeau, M. Drouet
Surface Science 714 (2021) 121908
An atomic-scale insight into Ni3Al slip traces
C. Coupeau, J. Michel, J. Bonneville, M. Drouet
Low temperature atomic-scale observations of slip traces in niobium
B. Douat, J. Bonneville, M. Drouet, L. Vernisse, C. Coupeau
Scripta Materialia 183 (2020) 81
Kinetics of anticrossing between slip traces and vicinal steps on crystal surfaces
C. Coupeau, D.M. Kazantsev, M. Drouet, V.L. Alperovich
Acta Materialia 175 (2019) 206
How slip traces modify the Au(111) reconstruction
D. Chauraud, J. Durinck, M. Drouet, L. Vernisse, J. Bonneville, and C. Coupeau
Phys. Rev. B 99, 195404 (2019) 195404
Slip trace-induced terrace erosion
B. Douat, J. Colin, R. Bergamaschini, F. Montalenti, M. Drouet, J. Bonneville, C. Coupeau
Applied Surface Science 466 (2019) 454
Atomic-scale insight into non-crystallographic slip traces in body-centred cubic crystals
B. Douat, C. Coupeau, J. Bonneville, M. Drouet, L. Vernisse, L. Kubin
Scripta Materialia 162 (2019) 292
Influence of terrace widths on Au(111) reconstruction
D. Chauraud, J. Durinck, M. Drouet, L. Vernisse, J. Bonneville, and C. Coupeau
Slip trace-induced vicinal step destabilization
C. Coupeau, O. Camara, M. Drouet, J. Durinck, J. Bonneville, J. Colin and J. Grilhé
Atomic reconstruction of niobium (111) surfaces
C. Coupeau, J. Durinck, M. Drouet,B. Douat, J. Bonneville, J. Colin, J. Grilhé
What can be learnt on the yield stress anomaly of Ni3Al using AFM observations
J. Michel, C. Coupeau, Y. Nahas, M. Drouet and J. Bonneville
An experimental UHV AFM-STM device for characterizing surface nanostructures under stress/strain at variable temperature
Y. Nahas, F. Berneau, J. Bonneville, C. Coupeau, M. Drouet, B. Lamongie, M. Marteau, J. Michel, P. Tanguy and C. Tromas
Rev. Scientific Instruments 84 (2013) 105117